DOWNLOAD: Single Event Effect Immunity for Life Critical Applications:White Paper

White Paper Abstract:

Various memory elements within electronic devices are susceptible to being upset when impacted by high energy particles within the Earth's atmosphere. In addition, other elements of a device may propagate induced pulses or transients that can result in errors in function. Given the potential exposure of medical devices to high neutron fluxes (due to cosmic rays as well as LINACs used in radiotherapy), designers must consider the impact of SEUs on safety and reliability.

Although estimating FIT rates for SRAM-based FPGAs within the radiotherapy environment is difficult due to the lack of specific studies, clearly the risk is not zero. Given the criticality of these applications to the life of the patient, SRAM-based PLDs are just not compatible with the reliability requirements that these applications impose.

Microsemi offers devices whose base technology is fundamentally immune to configuration upset. Building on a 20-year history of delivering high-reliability products to commercial avionics, military, and space applications, Microsemi is uniquely positioned to help designers understand the impact of SEUs and SETs and mitigate their effect.



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