DOWNLOAD: Understanding the Impact of Single Event Effects in Networking Applications:White Paper

White Paper Abstract:

Various memory elements within electronic devices are suspectable to being upset when impacted by high-energy particles within the Earth’s atmosphere. In addition, other elements of a device may propagate induced pulses or transients that can result in errors in function. In the critical functions of networking applications, these errors can cause a number of failures, included system crashes. Only one supplier of FPGAs offers devices whose base technology is fundamentally immune to upsets, helping suppliers of networking equipment achieve five nines of system reliability. Building on a 20-year history of delivering high-reliability products to commercial avionics, military, and space applications, Microsemi is uniquely positioned to help designers understand the impact of SEUs and SETs and mitigate their effect.



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